3 edition of Close-range photogrammetric measurement of static defections for an aeroelastic supercritical wing found in the catalog.
Close-range photogrammetric measurement of static defections for an aeroelastic supercritical wing
by National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division, National Technical Information Service, distributor] in [Washington, DC], [Springfield, Va
Written in English
|Other titles||Close range photogrammetric measurement of static defections for an aeroelastic supercritical wing.|
|Statement||Thomas A. Byrdsong, Richard R. Adams, and Maynard C. Sandford.|
|Series||NASA technical memorandum -- 4194.|
|Contributions||Adams, Richard R., Sandford, M. C., United States. National Aeronautics and Space Administration. Scientific and Technical Information Division.|
|The Physical Object|
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